Discover precise monitoring and control of opaque layers via laser photothermal technology


Non-contact, non-destructive, non-intrusive, non-radiative, fast and repeatable laser photothermal technology can precisely monitor and control layer thickness. Knowing the thickness of each layer and coating is important to monitor and optimize the quality of the wafer process.  

Further information about our solution for the semiconductor industry can be found in this “Controlling opaque layers” whitepaper. Additional highlights include:

 Which layers can be measured with laser photothermal technology

Our solution for a stable process in semiconductor industry

Download this whitepaper for your own benefit now. 


Precitec Optronik GmbH, Schleussnerstr. 54, D-63263 Neu-Isenburg, ✆ +49 6102 3676-100